For highly accurate profile measurements
Optical surface measurement system for quick,
non-contact topography and highly complex geometries in a Nano,
Micro and Macro range.
The possible applications range from Research and Development till
incoming goods control, quality control and damage analysis.
Compact, stand-alone, laboratory instrument including PC.
Advantages:
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Easy and convenient operation
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Quick data
collection
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Interaction-free, non-critical, rugged
measuring method
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Micro roughness values
for 2D line profiles
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Direction
differentiated roughness values of surfaces (analysis of texture
orientation)
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2D line scan topography, 3D illustration and
height profile.
Applications:
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Roughness analysis and structure
identification of flat, structured as well as curved surfaces
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Determination of macro and micro-geometries,
planarity control
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Surface control, e.g. on embossing rollers
(option: portable unit, TraceIt®)
